2018 Ned Kornfield Best Paper

“Fast and accurate linearity test for DACs with various architectures using segmented models”
Shravan Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal and Degang Chen.
(Iowa State University)

2018 Honorable Mention

“Concept Recognition in Production Yield Data Analytics”
Matt Nero, Jay (Chuanhe) Shan, Li-C Wang
(University of CA, Santa Barbara)

TTTC Lifetime Contribution Medal

M. Ray Mercer

 

 

IEEE Fellow 2019

Anne E Gattiker
IBM, Austin, Texas

TTTC Bob Madge Innovation Award

 

Peter Maxwell
On Semiconductor

 

G.W. Gordon Student Service Award

Jay (Chuanhe) Shan

University of California at Santa Barbara