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Welcome to the 2016 ITC Web

Sign up to Exhibit Register ITC Exhibitors Manual
Exhibits Workshops ITC Program Site
Advance Program Mobile Site ITC Program

Find your Way and Give Feedback on the ITC Mobile Site

The ITC Mobile Site has the latest locations for ITC events, and also has links to the online ITC Yellow Card surveys to let you rate each paper, panel and keynote. Works for both laptops and mobile devices, but is optimized for mobile.

The mobile site reflects changes made after the publication of the print Final Program. If a session is not where you think it will be, this is the place to go.

Poster Reviews

There was a problem with the Poster Yellow Cards. It has been fixed. Pick top posters at

A New ITC Nano-Blog – Updated 11/20/16, 5:46 pm – New November 17 entry from our Student Blogger, Allison Garcia

The ITC Nano-Blog has real-time thoughts about this year’s conference. Read the new entry on our student blogger’s first conference.
The first line: “Today I added several things to my list of professional and personal goals”

Try out our New ITC Website

Just in time for ITC we present a beta of the New ITC Website. Give it a try and send us your thoughts.

Thursday at Test Week – Day Five. More Sessions, More Exhibits, Two Panels.

Plus Keynote 3 (see below) and the beginning of Workshops. See the ITC Mobile Site Mobile Site for details on what is happening and to fill out your yellow cards.

ITC 2016 Thursday Keynote Speaker: Ken Hansen, CEO, Semiconductor
Research Corporation

Mr. Hansen will give the Thursday keynote address, Addressing Semiconductor Industry Needs: Defining the Future Through Creative, Exciting Research
Thursday, November 17, 2016 at 11:00 am

Ken Hansen, SRC

In the history of the semiconductor industry, there has been no other period in time with as much uncertainty in the way forward. But with uncertainty comes great opportunity. There is a need for transformative innovation fueled by breakthrough research to reinvigorate the growth of the industry. This talk will identify some of the new exciting challenges the industry is facing and research areas where investment is needed to address them. Systems of the future —autonomous vehicles, internet of things, self-adaptive configurations modeled on biology—will require advanced techniques to test them, secure them, reduce their power, and produce them without error. This increase in complexity coupled, with a decreasing ability to rely on deterministic circuits, requires new approaches to be created by cross-disciplinary teams co-optimizing across the entire design hierarchy space.

More information can be found on the keynote page.

ITC 2016 Wednesday Keynote Speaker: Professor Rob A. Rutenbar, University of Illinois, Urbana-Champaign

Prof. Rutenbar will give the Wednesday keynote address, Hardware Inference Accelerators for Machine Learning
Wednesday, November 16, 2016 at 4:30 pm. This is a special keynote in honor of Professor Edward J. McCluskey

Rob Rutenbar, University of Illinois

Machine learning (ML) technologies have revolutionized the ways in which we interact with large-scale, imperfect, real-world data. As a result, there is rising interest in opportunities to implement ML efficiently in custom hardware. We have designed hardware for one broad class of ML techniques: Inference on Probabilistic Graphical Models (PGMs). In these graphs, labels on nodes encode what we know and “how much” we believe it; edges encode belief relationships among labels; statistical inference answers questions such as “if we observe some of the labels in the graph, what are most likely labels on the remainder?” These problems are interesting because they can be very large (e.g., every pixel in an image is one graph node) and because we need answers very fast (e.g., at video frame rates). Inference done as iterative Belief Propagation (BP) can be efficiently implemented in hardware, and we demonstrate several examples from current FPGA prototypes. We have the first configurable, scalable parallel architecture capable of running a range of standard vision benchmarks, with speedups up to 40X over conventional software. We also show that BP hardware can be made remarkably tolerant to the low-level statistical upsets expected in end-of-Moore’s-Law nanoscale silicon and post-silicon circuit fabrics, and summarize some effective resilience mechanisms in our prototypes.

More information can be found on the keynote page.

ITC 2016 Keynote Speaker: Walden C. Rhines, Chairman and Chief Executive Officer, Mentor Graphics

Mr. Rhines will give the keynote address, The Business of Test: Test and Semiconductor Economics
at the Plenary Session of ITC, November 15, 2016 at 9 am.

Wally Rhines, Mentor

Test methodology changes have historically been driven largely by necessity—critical needs for cost reduction or quality improvements. This history makes possible the prediction of future changes. Dr. Rhines will review the driving forces for prior discontinuities in design-for-test, analyze the rates of adoption of new test methodologies, and discuss the likely forces that will change our test priorities in the future.

Walden C. Rhines is Chairman and Chief Executive Officer of Mentor Graphics, a leader in worldwide electronic design automation with revenue of $1.2 billion in 2015. During his tenure at Mentor Graphics, revenue has nearly quadrupled and Mentor has grown the industry’s number one market share solutions in four of the ten largest product segments of the EDA industry. He joined Mentor in 1993 from Texas Instruments (TI) where he was most recently Executive Vice President in charge of TI’s semiconductor business. Rhines has served five terms as Chairman of the Electronic Design Automation Consortium. He is also a board member of the Semiconductor Research Corporation and First Growth Children and Family Charities. He received a BSE degree from the University of Michigan, an MS and Ph.D. from Stanford University, an MBA from Southern Methodist University and Honorary Doctor of Technology degrees from Nottingham Trent University and the University of Florida.

Test Week Tutorial Details Now Available

In 2016 ITC offers 12 excellent tutorials to get you started on an area of test or to help you go into more depth in an area you are already familiar with. You can find out more details about the tutorials at the
Tutorials Page or by clicking the Tutorials button above.

ITC is proud to host the NXP Smarter World Tour

Experience NXP’s Smarter World Tour at ITC as the famed “Lab on Wheels” brings the Internet of Things to life on the exhibit floor at ITC. With more than 170 demos that let you interact with ADAS demos, RF cooking devices, Smart home automation, wearables and more, you will get a first-hand look at the connected world of tomorrow.
Follow this link to get to the NXP Smarter World Tour home page and watch a video about the truck.

Call for Volunteers for ITC

ITC is a volunteer driven conference. Besides paper authors, paper reviewers and program committee members, many people work behind the scenes to put on ITC each year. It is a big job and we need help.
Here is more information on volunteer opportunities and how to contact us. Thanks for supporting ITC.

Evaluation Engineering Magazine and ITC are Media Partners

Evaluation Engineering is the magazine for engineers and engineering managers responsible for test and total product quality in electronics. Evaluation Engineering is written by engineers for engineers Visit them at or on the ITC Exhibit Floor in October.

Press Coverage of ITC

Coverage of ITC in Evaluation Engineering

ITC Announces Partnership with VLSI.

VLSI is an award-winning provider of market research and economic analysis on the technical, business, and economic aspects within semiconductor, nanotechnology, and related industries. VLSI provides intelligence for faster and better decision making in the areas of semiconductors, photovoltaics, LEDs, display, manufacturing, materials, and critical subsystems. VLSI was founded in 1976.
Visit them at

About ITC

International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification and validation, test (DFT, ATPG, and BIST), diagnosis, failure analysis and back to process, yield, reliability and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

Updates and News

About International Test Conference

Background information about ITC.

Important Links

The ITC Exhibitors Home Page

ITC Group on Linked in.

Media Partners

Author Log-in to ITC Program Site

More information:

ITC office
phone: +1 (202) 973-8665
fax: +1 (202) 331-0111