International Test Conference - International Test Conference

International Test Conference
The world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

2017 Program Activity

Get an early view of the 2017 program

Keynote Speakers

Robert Klosterboer, Executive Vice President and General Manager, Analog Solutions Group, ON Semiconductor. Testing beyond the green light

Sanu Mathew, Senior Principal Engineer, Circuits Research Labs, Intel Corporation, Hillsboro, Oregon. Ultra-low Energy Security Circuit Primitives for IoT Platforms

Joachim Kunkel, General Manager, Solutions Group, Corporate Staff, Synopsys. Automotive Keynote

Headlines

Workshops for 2017

August 8, 2017/0 Comments/in Headlines /by Ron Press

ART and DATA workshops

ITC-Asia is coming up Sept 13-15

August 3, 2017/0 Comments/in Headlines /by Ron Press

Join us in Taiwan

Great success at ITC India

July 16, 2017/0 Comments/in Headlines /by Ron Press

over 300 attendees

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Quick Links

Contact ITC

ITC office
phone: +1 (202) 973-8665
fax: +1 (202) 331-0111
email: ITC@courtesyassoc.com

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