International Test Conference

International Test Conference
The world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

2017 Program Activity

Get an early view of the 2017 program

Here is an early view of the 2017 ITC program. Note that it is preliminary and some items and times may change.

Keynote Speakers

Robert Klosterboer, Executive Vice President and General Manager, Analog Solutions Group, ON Semiconductor. Testing beyond the green light

Sanu Mathew, Senior Principal Engineer with the Circuits Research Labs at Intel Corporation, Hillsboro, Oregon. Ultra-low Energy Security Circuit Primitives for IoT Platforms