Join Us at the AI Track at International Test Conference We are excited to invite you to the AI Track at this year’s International Test Conference (ITC), where we will explore cutting-edge advancements in AI and its applications in semiconductor testing. The AI track will feature four dynamic sessions, covering a range of innovative topics […]
ITC Social media links are available at the top right on the website. Here you can find YouTube videos from previous years which include keynotes, plenary sessions, award recipients, and invited talks. There are also links to other social media platforms.
See the various videos from the main stage The opening plenary includes a summary of the program from Jeff Rearick and awards given by Teresa McLaurin and Yervant Zorian. Opening Keynote by Debendra Das Sharma Diamond event presentation by Siemens and Darshan Kobla of Microsoft Wednesday keynote/panel on Metaverse by Savita Banerjee, Caitlin Kalinowski, and […]
2022 Best paper award “Language Driven Analytics for Failure Pattern Feedforward and Feedback”, Min Jian Yang, Yueling (Jenny) Zeng and Li-C. Wang, University of California, Santa Barbara, USA 2022 honorable mention “PPA Optimization of Test Points in Automotive Designs”, Brian Foutz, Sarthak Singhal, Prateek Kumar Rai, Krishna Chakravadhanula, Vivek Chickermane, Bharath Nandakumar, Sameer Chillarige, Christos Papameletis and Satish Ravichandran, Cadence, […]
