Entries by Ron Press

AI in Test (AIT) Workshop CFP

Special Call for Session Proposals AI in Test (AIT) Workshop 2026 International Test Conference (ITC) Dear Colleagues, Artificial Intelligence (AI) is rapidly reshaping semiconductor test engineering. Engineers are increasingly adopting AI assistants, agentic coding environments, custom AI agents, MCP-based service architectures, and AI-powered applications to improve engineering productivity and transform traditional workflows. To provide a […]

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Industry Test Challenges Meeting

The Industry Test Challenges meeting at the International Test Conference (ITC@ITC) is an event that has been led by Phil Nigh for many years as a side gathering on Monday of Test Week.  Despite Phil’s retirement, but with his ongoing support, we are continuing this tradition but elevating it to be a formal part of […]

Discussion forum

What topics are you interested in discussions prior to the conference?  We can start some conversations in this blog.  Very active topics will be moved to their own headline blogs.  Thanks for your thoughts.

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ITC 2026 in San Antonio

We have a new venue for ITC 2026 – San Antonio.  We hope you can join us and have a chance to explore this interesting city. Visit San Antonio, Texas | Your Guide to the Alamo City   Our conference hotel is the Grand Hyatt

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