AI in Test (AIT) Workshop CFP
Special Call for Session Proposals AI in Test (AIT) Workshop 2026 International Test Conference (ITC) Dear Colleagues, Artificial Intelligence (AI) is rapidly reshaping semiconductor test engineering. Engineers are increasingly adopting AI assistants, agentic coding environments, custom AI agents, MCP-based service architectures, and AI-powered applications to improve engineering productivity and transform traditional workflows. To provide a […]





