It is our privilege to welcome you to the 51st International Test Conference (ITC) sponsored by IEEE and the IEEE Philadelphia Section. ITC is the world’s premier conference dedicated to electronics test.  Our volunteer committees worked very hard to provide to you an exciting event with a balance of the latest research and practical techniques related to electronics test.  In this exceptional pandemic year, taking the safety of all participants into consideration, we have moved to a fully online conference with shorter days to maximize the opportunity to attend from home or office without any travel being required.

As we start the second half century of ITC, the program will look at a variety of traditional and emerging areas of test.  Analog, ATE, and DFT-based papers will form an important part of the program.  This year we also had a record number of submissions for testing with and for AI.  Specifically, the use of AI algorithms and techniques to improve test, debug, and diagnosis was well-represented, while other AI-focused submissions concentrated on AI hardware.  Secure and Trusted Electronics will also be an important focus of multiple sessions on Wednesday, while Automotive test will once again consist of its own track on Thursday—leading naturally into the leading into the Automotive Test Workshop which immediately follows the conference, also in online format.  Each day of the conference will begin with a memorable keynote address, and later sessions will include panels, posters, and a chance to visit ITC exhibits.

We have selected several papers based on reviewers’ scores to be Distinguished Papers.   These outstanding papers will be identified in the program.  We are also continuing the inclusion of Industrial Practice (IP) papers in the conference to provide an opportunity to showcase important case studies and other approaches proven in an industrial environment.  We are also introducing a new category of papers—short papers that will be included in the proceedings and conference with a reduced length compared to regular papers.   Short Papers and IP Papers will be clearly marked as such in both the conference and the formal proceedings of ITC. 

ITC is also continuing its expanded presence!  For the fourth year, in 2020 there are ITC-Asia  and ITC-India conferences in Taiwan and Bangalore respectively. 

The conference is organized in a way to provide you various methods to learn and discuss topics related to electronics test. Our keynote speakers are well known industry leaders and academic researchers that provide exciting insights.  Papers in the technical program were selected through a rigorous review process.  Regular technical papers will be presented in 20 minute time slots, with a few minutes for questions at the end of each paper.  Short Papers and IP papers will each have 15 minute time slots (including questions) allocated during the conference for presentation of the work.. 

The traditional exhibition floor has been replaced with online exhibition “booths”.  Solutions providers will be available for discussion and learning about their offerings and one-on-one meetings will be easy to arrange.  A corporate forum is held online and merged into the program, where exhibiting companies present about their products. This year we have one poster session held in a dedicated time slot with the ability to interact directly with the authors. Posters provide a very comfortable and informal environment to discuss details.

We recognize that networking is extremely valuable to our attendees. The online platform makes it easy to connect with colleagues and other specialists via chat rooms.

On behalf of the 2020 International Test Conference steering committee, program committee and all the dedicated volunteers who are key to making the program complete, we welcome you to this year’s exciting technical program and exhibits.

Peter Maxwell
General Chair

Jennifer Dworak
Program Chair

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