It is our privilege to welcome you to the 50th International Test Conference (ITC) sponsored by IEEE and the IEEE Philadelphia Section. ITC is the world’s premier conference dedicated to electronics test. Our volunteer committees worked very hard to provide to you an exciting event with a balance of the latest research, practical applications, and networking opportunities. This year we are back in Washington, DC the week of November 12, 2019.

Our topics include emerging test needs for artificial intelligence,  automotive and IoT, hardware security, system test, analog and mixed-signal test, yield learning, test analytics, test methodology, benchmarks, test standards, memory and 3D test, diagnosis, DFT architectures, functional and software-based test.

Since this is our 50th year celebration, we will have a few special events and sessions.  We will announce more in the highlights on the front page of the website.

In addition to the usual best paper award, we have selected the top papers based on reviewers’ scores to be Distinguished Papers.   These outstanding papers will be identified in the program.

ITC is expanding its presence!  We had great success with our sister conferences, ITC-Asia  and ITC-India in.

The conference is organized in a way to provide you various methods to learn and discuss topics related to electronics test. Our keynote speakers are well known industry leaders and academic researchers that provide exciting insights. The technical papers are 20 minute presentations of papers that were selected from a rigorous review process with a few minutes for questions at the end of each paper. The exhibition floor consists of solutions providers who are available for discussion and learning about their offerings. A corporate forum is held on the exhibit floor where exhibiting companies present about their products. This year we plan to have one poster session held on the exhibition floor. Posters provide a very comfortable and informal environment to discuss details with the authors.

We recognize that networking is extremely valuable to our attendees. Multiple breaks and social events are integrated in the program to allow you to network with colleagues and other specialists. Free lunches are provided in the exhibit hall for full- and one-day ITC conference attendees.

On behalf of the 2019 International Test Conference steering committee, program committee and all the dedicated volunteers who are key to making the program complete, we welcome you to this year’s exciting technical program and exhibits.

sponsored by:

General Chair, Li-C Wang, University of California, Santa Barbara

Program, Bill Eklow

The ITC logo can be used in connection to your participation in ITC.