The first in-person ITC since 2019 was a rousing success! ITC week took place at Disneyland, in Anaheim, California on the 25-30 September and included 12 tutorials, two workshops and a very strong ITC program. The ITC program comprised three keynotes that spanned the future, present and past of DFT and test engineering as well as a visionary talk about ultra low-power AI accelerators. In addition, there were four panels and many technical sessions addressing topics such as AI, automotive, memory and hardware security just to name a few.

However, what made this ITC so special was meeting with and exchanging ideas with colleagues we hadn’t seen in years and making new contacts. The conference started Monday evening with a panel and post-panel reception. On Tuesday, we started with the plenary and first keynote and ended the day with the ITC Grand Reception which took place on Adventure Lawn, a beautiful setting. There was plenty of food and drink, a live band, but most of all a multitude of discussions ongoing the entire night. It was so great to see and talk to everyone in person!

You can still register for ITC 2022 and get access to the presentation videos which are available until 31 December 2022! Registration also includes a copy of the conference proceedings.

Next year we will again be at Disneyland in Anaheim, CA. Come join us!

Teresa McLaurin General Chair, ITC 2022

 

ITC 2022 Exhibition Passport Daily Drawing

winners from Day 1

• Stuart Pearce – iPad
  • 
• Nicholai L’Esperance – $100 Amazon gift card
  • 

winners from Day 2

• Eli Scott – iPad
  • 
• Kwame Amponsah – $100 Amazon gift card
  • 

winners for Day 3

• Jan-Gudmund Ness – iPad
• Yuhai Ma – $100 Amazon gift card
  • 

Daily Prizes: one Apple iPad and one $100 Amazon gift card per day drawn from eligible
Passport entries in collection boxes.

Eligibility: must qualify all following conditions

1. The Passport holder must have a valid ITC2022 full registration. Exhibition-only
   and single-day passes are not qualified. Be sure to put your name on the Passport
   entry.
2. A qualified Passport entry must be stamped by the one of exhibitor(s) in the
   following at the larger box(es) “Destination”
   Destination Exhibitor(s):
    Siemens
3. A qualified Passport entry must also be stamped by SIX different exhibitors other
   than the above Destination Exhibitor(s) in the smaller boxes “General”
4. You must enter each day to qualify for that particular day’s drawing. That is, the
   collection box(es) will be cleaned after daily drawing.

 

Drawing

1. Collection boxes will be located on the exhibit floor.
2. Drawing will be conducted on the exhibit floor at the end of each day of the 3
   days of exhibition. That is, 5:30pm on Tuesday, 4:30pm on Wednesday and 1pm
   on Thursday.
3. You do NOT need to be present at the drawing.
4. Winners will be announced at ITC web site and by email by the end of day.
5. Winners are expected to receive prizes at the award presentation (shown below).
   If you could not make it, please contact ITC Exhibition Chair Chen-Huan Chiang
   chen-huan.chiang@intel.com
6. We apologize that ITC will not be able to mail the prize to you.
7. Award presentations
   1. Prizes will be presented at the beginning of the next day’s keynote at 9am. That is,
      Wed keynote for Tue’s winners and Thu keynote for Wed’s winners. — Except
      for the last day, prizes will be presented immediately after the drawing at 1pm
      Thu on the exhibition floor.

IEEE International Workshop on Silicon Lifecycle Management (SLM) 2022

– hybrid format (inria.fr) SEPTEMBER 29-30, 2022

AIM OF THE WORKSHOP

With increasing system complexity, security, stringent runtime requirements for functional safety, and cost constraints of a mass market, the reliable and secure operation of electronics in safety- critical, enterprise servers and cloud computing domains is still a major challenge. While traditionally design time and test time solutions were supposed to guarantee the in-field dependability and security of electronic systems, due to complex interaction of runtime effects from running workload and environment, there is a great need for a holistic approach for silicon lifecycle management, spanning from design time to in-field monitoring and adaptation. Therefore the solutions for lifecycle management should include various sensors and monitors embedded in different levels of the design stack, access mechanisms and standards for such on-chip and in- system sensor network, as well as data analytics on the edge and in the cloud. The SLM Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike.
SLM will take place in conjunction with the IEEE International Test Conference (ITC 22); is sponsored by IEEE Philadelphia Chapter; and conceived by the IEEE Test Technology Technical Council (TTTC).