The safety and well-being of all conference participants is our priority. After evaluating the current COVID-19 situation, the decision has been made to transform the in-person component of ITC into an all-digital conference experience – ITC will now be an online event. Therefore, ITC will no longer take place in Washington, DC and will instead take place virtually. The conference dates remain the same – November 3-5, 2020. Proceedings will not be cancelled, and publications will continue as planned. For questions, contact email@example.com.
There are templates and additional information available on the website program page “quick links” on the right of the page.
Authors are invited to submit a single-page poster proposal. Here is a poster template and example. Note that you submit the one-page extended poster abstract using the poster template. Once accepted, then you prepare the poster itself for the conference.
- Poster abstract submission deadline: Aug 7
- Author notification: TBD
We received very nice feedback on the ITC mobile app. If you haven’t already completed the mobile app survey (from within the app) then please do so because your feedback is valuable to us.
The winner of the photo contest was Mr. Makoto Eiki with the most likes on the mobile app for this nice sunset photo.
There are also a few hundred photos from a professional photographer which you can access with this link on dropbox – https://www.dropbox.com/sh/3eicrfi13zk1cow/AAD9N8ok25blbPfJY6dIvYLva?dl=0.
We plan to use the mobile app again next year. Here is a nice summary of frequently asked questions from the app how-to guide – link
Thanks for participating in ITC and thanks for you feedback.
2019 ITC Marketing Chair
2018 Ned Kornfield Best Paper
“Fast and accurate linearity test for DACs with various architectures using segmented models”
Shravan Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal and Degang Chen.
(Iowa State University)
2018 Honorable Mention
“Concept Recognition in Production Yield Data Analytics”
Matt Nero, Jay (Chuanhe) Shan, Li-C Wang
(University of CA, Santa Barbara)
TTTC Lifetime Contribution Medal
M. Ray Mercer
IEEE Fellow 2019
Anne E Gattiker
IBM, Austin, Texas
TTTC Bob Madge Innovation Award
G.W. Gordon Student Service Award
Jay (Chuanhe) Shan
University of California at Santa Barbara
AFWERX CHALLENGE at International Test Conference, November 12-14, 2019
AFRL and AFWERX have partnered to launch the Supply Chain Provenance Challenge geared around demonstrating solutions that help solve the current microelectronic supply chain problem. The challenge is attempting to identify solutions that are non-destructive in nature and prove provenance and suitability for military use of microelectronic parts in commercial off the shelf hardware to be used on base installations or in operation.
Attend this special event on the ITC Exhibit floor, booths 509, 511, & 513.
There are three participant teams
- BATTELLE, DPMG, KBSI
- Brunel University London, Supply Dynamics
- Object Security, Riverside Research
Air Force Research Lab (AFRL), Under Secretary of Defence for Research and Engineering, Cisco, & Nvidia
As part of its 50th anniversary celebration, ITC is proud to announce a unique and informative venue: The ITC Global Test Forum (GTF), which honors the geographic breadth of the test community and highlights the global reach of ITC during the past 50 years.
This Forum features contributions of prominent test technology related conferences and workshops established around the globe in the past 50 years. This Forum will be held as a special village at the 50th ITC Atrium just outside the exhibition hall. It consists of a circular set of stands/booth representing the participating conferences. Each participating conference will be assigned a dedicated stand/booth with a large monitor, to be used for an interactive presentation about their conference, covering the past achievements, present activities and future opportunities.
Participating in the Global Test Forum are:
- ART (Automotive Reliability and Test)
- ATS (Asian Test Symposium)
- AQTR (Automation, Quality and Testing, Robotics)
- CTC (China Test Conference)
- CSIT (Computer Science and Information Technologies )
- DATE (Design Automation and Test Europe)
- DDECS (DESIGN & DIAGNOSTICS OF ELECTRONICS CIRCUITS & SYSTEMS)
- ETS (European Test Symposium)
- EWDTS (IEEE EAST-WEST DESIGN & TEST SYMPOSIUM)
- HOST (Hardware Oriented Security and Trust)
- IOLTS (International On-Line Testing Symposium)
- ITC Asia
- ITC India
- IVSW (International Verification and Security Workshop)
- MECO (Mediterranean Embedded Computing Resources )
- MTV (Microprocessor Test and Verification Conference)
- NATW (North Atlantic Test Workshop)
- VTS (VLSI Test Symposium)
In addition to the interactive presentation, each conference will be requested to publish a 4‐page paper about the corresponding conference covering past, present and future. Each conference could be represented by delegates.
On Tuesday, Nov. 12 at 2pm, the GTF unveiling ribbon cutting ceremony will take place to start interactive presentations. As the exclusive GTF supporter, the Chinese Academy of Sciences has kindly agreed to contribute towards the realization of this special GTF village.
#itctestweek #50ITC #ART #ATS #AQTR #CTC #CSIT #DATE #DDECS #ETS #EWDTS #HOST #IOLTS #ITCAsia #ITCIndia #IVSW #MECO #MTV #NATW #VTS