Workshops for 2017

IEEE Computer Society Test Technology Technical Council Workshops

Thursday and Friday

General Workshop Information

Two workshops are being held in parallel immediately following ITC 2017. They start with an opening address on Thursday afternoon, November 2, followed by a technical session. A reception for all workshop participants will be held on Thursday evening. The remaining the technical sessions will be held on Friday, November 3. The technical scope of each workshop is described below.


Workshop Registration

All workshop participants require registration. To register in advance for one of the workshops, do so online. Otherwise, register on-site at regular rates during Test Week at the ITC registration counter. Admission for on-site registrants is subject to availability. Discount workshop registration rates apply until October 1, 2017. See the registration page for details. Workshop registration includes the opening address, technical sessions, digest of papers, workshop reception, break refreshments, continental breakfast and lunch.


Digest of Papers

A digest of papers will be distributed only to attendees at the workshops as an informal proceedings.


Workshop Schedule

Both workshops will adhere to the same schedule:


            Thursday, November 2                Friday, November 3
Registration 2:00 p.m. – 7:00 p.m. Registration 7:30 a.m. – 10:00 a.m.
Opening Address 4:00 p.m. – 4:30 p.m. Technical Sessions 8:00 a.m.  –  4:00 p.m.
Technical Session 4:30 p.m. – 6:30 p.m.
Reception 7:00 p.m. – 9:00 p.m.


                      Note: Workshop schedule is subject to change


Further Information

For more information on the two workshops contact their organizers by e-mail or check the TTTC Web site or see the ITC web workshop page.


Scope: The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, stringent runtime requirements for functional safety, security and cost constraints of a mass market the reliable operation of electronics in safety-critical domains is still a major challenge. The ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike. The scope of the workshop includes, but not limited to:

  • Functional Safety in automotive domain
  • Validation of automotive systems
  • Aging effects on automotive electronics
  • Automotive standards and certification
  • Power-on & Periodic Self-test
  • High quality test and DPPB
  • Robustness and Security in Automotive


General Chair: Yervant Zorian,

Program Chair: Paolo Bernardi,


  • DATA: IEEE International Workshop on Defect, Adaptive Test, Yield and Data Analysis

Scope: In test, we use data every day. Yield data, throughput data, statistical data, reliability data, outlier data, general production data are all in everyday use. However, data means much more than that. Advances in our industry allow data from wafer fab to be reused in studying system level test results. Field failure studies now routinely uses wafer probe data to understand root cause. Data has now become a product life cycle requirement—cradle to grave. Today access to the data has become an issue; the control and sharing of data among business partners. How to efficiently process data to extract the golden nuggets of useful information amid the gigabytes of unimportant noise remains a focus and a challenge for test professionals. Workshop topics to include:

  • Data storage and security
  • Analog fault modeling & coverage
  • Adaptive test for product engineers
  • Data mining methods for test data processing
  • High/low voltage and stress testing
  • Yield learning and analysis
  • Fault localization and diagnosis
  • Product and project case studies
  • Advanced DPPM reduction techniquew


General Chair: Jeff Roehr,

Program Chair: Wesley Smith,



ITC-Asia is coming up Sept 13-15

Call for Participation

The 1st IEEE International Test Conference in Asia

(ITC-Asia 2017)

Taipei, Taiwan

(Co-Located with SEMICON Taiwan)

September 13-15, 2017


Early registration deadline: Aug. 11, 2017


(Program Highlights)1 Panel, 4 Keynote Speeches, 3 Half-Day Tutorials, 3 Embedded Tutorials, more than 10 Invited Talks from Industry, and 28 State-of-the-Art Technical Papers.

The entire technical program is available at


Heterogeneous Integration – Design and Test Challenges Organized by Prof. Cheng-Wen Wu

(Keynote Speeches)

Keynote 1: Hardware Security – Verification, Test, and Defense Mechanisms-       Prof. Tim Cheng (Hong Kong U. of Science and Technology)

Keynote 2: Convergence of Electronic and Semiconductor Systems, and Its Impact on Testing Technology – Dr. Ishih Tseng (Chroma ATE Inc.)

Keynote 3: Seven Major Trends that are Changing how we Test ICs-       Dr. Phil Nigh (GlobalFoundires)

Keynote 4: Test Emerging Memories-       Dr. Robert Aitken (ARM Research) We sincerely look forward to your participation,

Best Regards,

Steering Committee Chair:  Cheng-Wen Wu

General Co-Chairs:  Kuen-Jong Lee and Li-C. Wang

Program Chair:  Shi-Yu Huang

Great success at ITC India

ITC India was held in Bangalore with great success from July 9-11.




See details from the conference at their web site.


Gerald W. Gordon Award

ITC Is Now Accepting Nominations for the 2017 Gerald W. Gordon Award for Student Volunteerism

 The International Test Conference (ITC), the Test Technology Technical Council and the IEEE Philadelphia Section sponsor the Gerald W. Gordon Award.   The award to the recipient consists of complimentary tutorial registration for one morning and one afternoon tutorial for each of the 2 days they are offered, complimentary full conference registration for ITC, complimentary registration for one of the at conference workshops, up to $750 for travel expenses to the conference and free lodging for the nights of attendance.


Eligibility Requirements

The Gerald W. Gordon  Award recipient must be a student in good standing at an accredited university or college. Award recipients must have done volunteer work for one or more IEEE conferences, symposia, workshops and/or organizations dedicated to the development of electronics design and testing fields.

Consideration shall be given to the amount of volunteer service given; the breadth of volunteer service given; the impact of the volunteer service give; and worthiness of the candidate.

Nomination Process

The form for nominating a candidate can be obtained by clicking on the following link, “2017 Gerald W. Gordon Award Nomination form”.  The nominator must complete and submit an application form to summarize why the applicant is qualified for the award and list the relevant service work.  In addition, the nominator must identify 2, but not more than 5 endorsers.  The nominator must inform the endorsers that they need to email an endorsement of the candidate as described on the nomination form.  The nomination form and endorsement emails should be sent to Kenneth Mandl at and Yervant Zorian at No later than September 22, 2017.  All candidates will be notified of the selection decision by October 2, 2017.


Hotel Reservations for ITC2017 in Fort Worth

Reservations for the two ITC Hotels in Fort Worth, the Sheraton and the Omni, are available through Connections Housing which is the only authorized way to make your reservations.  Please email Jay Pierce with Connections Housing at to make your reservations.


2016 Plenary Introduction & Awards

Watch the awards portion of the 2016 ITC Plenary.  Each year ITC honors contributions made by industry leaders and innovators.  This 27 minute video shows the opening remarks for 2016 ITC and recipients of awards during the plenary.

2016 ITC opening remarks

Jeff Rearick, Bob Madge Innovation Award






2016 plenary awards:

ITC Ned Kornfield Best Paper Award 2014

Yield Optimization Using Advanced Statistical Correlation Methods

Jeffrey Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C Wang, Magdy Abadir


ITC Ned Kornfield Best Paper Award 2015

A Structured Approach to Post Silicon Validation and Debug using Symbolic Quick Error Detect

David Lin, Eshan Singh, Clark Barrett, Subhasish Mitra


ITC Most Significant Paper Award 2005

Invisible Delay Quality Lights Up What Could Not Be Seen

Yasuo Sato, Seiji Kajihara, Toshiyuki Maedo, Atsuo Takanori, Nozuyama


ITC Most Significant Paper Award 2006

Preferred Fill:  A Scalable Method to Reduce Capture Power for Scan Based Designs

Santiago Ramersaro, Xijiang Lin, Zhuo Zhang, Sudhaker Reddy, Irith Pomeranz, Janusz Rajski

TTTC Lifetime Contribution Medal

Janak H. Patel

TTTC Bob Madge Innovation Award

Jeff Rearick

G.W. Gordon Student Service Award

Grigor Tshagharyan

How do I get there?

Book Your Ride From/To the DFW Airport through ITC and Save!

Fort Worth Texas

The Fort Worth population of over 800,000 people blends its cattle and oil heritage seamlessly with an ever-growing, diverse array of new businesses and industries. Fort Worth was the fastest growing large city with more than 500,000 population between 2000 and 2010, and is now the 16th largest city in the United States. The Fort Worth convention center is conveniently located in the heart of a very walkable, cosmopolitan downtown.