It is our privilege to welcome you to the 48th International Test Conference (ITC) sponsored by IEEE and the IEEE Philadelphia Section. ITC is the world’s premier conference dedicated to electronics test.  Our volunteer committees worked very hard to provide to you an exciting event with a balance of the latest research, practical applications, and networking opportunities.  We are holding ITC 2017 in Fort Worth, Texas the week of October 30, 2017.

The conference is organized to provide you various ways to learn and discuss important topics from post-design to productization. In this year, we will devote one day on the theme of automotive and one day on the theme of security. Keynotes, technical papers, invited talks, tutorials, and panels will be provided for these two special themes. Other important topics to be presented and discussed in the conference will include: heterogeneous integration, high-speed interface, emerging systems and devices, system test, test data analytics, and test standards, among others which will be presented in more detail in the final program layout (expected to be online in early August).

ITC program also includes half-day tutorials and one-and-half-day workshops on selected topics to enable more in-depth learning and discussion. This year, the Automotive Day in the program will be followed by the Automotive Test Workshop organized by IEEE TTTC.

 

The exhibition floor presents the state-of-the-art solutions where those providers are available to discuss their most up-to-date offerings.  A corporate forum is held on the exhibit floor where exhibiting companies present about their products.  This year we have one poster session held on the exhibition floor.  Posters provide a very comfortable and informal environment to discuss details with the authors.

We recognize that networking is extremely valuable to our attendees.   Multiple breaks and social events are integrated in the program to allow you to network with colleagues and other specialists.  Free lunches are provided in the exhibit hall for full- and one-day ITC conference attendees.

On behalf of the 2017 International Test Conference steering committee, program committee and all the dedicated volunteers who are key to making the program complete, we welcome you to this year’s exciting technical program and exhibits.

Li-C. Wang, General Chair