Wednesday, November 1, 10:30 am – 12:00 pm

Session 8: Interfaces – Room 201 A/B

Dave Armstrong (Advantest, USA)
Anita Pratti (Texas Instruments, USA)
8.1: Use Models for Extending IEEE 1687 to Analog Test
Peter Sarson (ams AG, Austria)
Jeff Rearick (AMD, USA)
8.2: Single-Pin Test Control for Big A, little d Devices
Michael Laisne, Hans Martin von Staudt, Sourabh Bhalerao, Mark Eason (Dialog Semiconductor, USA)
8.3: Marginal PCB Assembly Defect Detection on DDR3/4 Memory Bus
Sergei Odintsov (Tallinn University of Technology, Estonia)
Artur Jutman, Sergei Devadze (Testonica Lab, Estonia)

Session 9: Delay Test and Quality – Room 202 C/D

Mike Vachon (Cadence Design Systems, USA)
Janusz Rajski (Mentor Graphics, USA)
9.1: Kernel-based Clustering for Quality Improvement and Excursion Detection
Nik Sumikawa (NXP, USA)
Matthew Nero, Li-C. Wang (University of California, Santa Barbara, USA)

9.2: Exploiting Path Delay Test Generation to Develop Better TDF Tests for Small Delay Defects

Ankush Srivastava (NXP Semiconductor India Pvt Ltd, India)
Adit Singh (Auburn University, USA)
Virendra Singh (Indian Institute of Technology (IIT) Bombay, India)
Kewal Saluja (University of Wisconsin, USA)

9.3: POSTT: Path-oriented Static Test Compaction for Transition Faults in Scan Circuits

Irith Pomeranz (Purdue University, USA)

Session S3: Special Session: Emerging Topics in Security and Trust I – Room 202 A/B

Jennifer Dworak (Southern Methodist University, USA)
S3.1: Test Opportunities to Reduce Time and Expertise Required to Assess (TERA) for Trust
Brian Dupaix (Air Force Research Lab, USA)
S3.2: Fault Injection Attacks and their Mitigation in Embedded Processors
Patrick Schaumont (Virginia Tech, USA)
S3.3: Opportunities in Emerging Technologies for Hardware Security
An Chen (Semiconductor Research Corporation, USA)

Session S4: Special Session: Machine Learning in Testing Applications – Room 201 C

Xiaowei Li (Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy of Sciences, China)
Peilin Song (IBM, USA)
Xinli Gu (Huawei Technologies, Inc., USA)
S4.1: The Emerging Applications of Machine Learning in Testing
Yu Huang (Mentor Graphics, USA)
S4.2: Enhanced Lithographic Hotspot Detection Through Design of Experiments
Yiorgos Makris (UT Dallas, USA)
S4.3: Opportunities in Machine Learning and Test
Rob Aitken (ARM, USA)