Thursday, November 2, 9:00 am – 10:30 am

Session 11: Functional and Software-based Test – Room 201 A/B

Chair:
Sounil Biswas (Altera, USA)
Discussant:
Prab Varma (Veritable, USA)
11.1: Software-based Online Self-Testing of Network-on-Chip using Bounded Model Checking
Ying Zhang (The School of Software Engineering, Tongji University, China)
Krishnendu Chakrabarty (Duke University, USA)
Huawei Li (Institute of Computing Technology, Chinese Academy of Sciences, China)
Jianhui Jiang (The School of Software Engineering, Tongji University, China)
11.2: RTL Functional Test Generation Using Factored Concolic Execution 
Sonal Pinto, Michael S. Hsiao (Virginia Tech, USA)
11.3: Modeling Trans-Threshold Correlations for Reducing Functional Test Time in Ultra-Low-Power Systems
Christopher Lukas, Farah Yahya, Ben Calhoun (University of Virginia, USA)

Session 12: Die Inking, Test Chips and Aging – Room 202 C/D

Chair:
Glenn Colon-Bonet (Intel Corporation, USA)
Discussant:
John Carulli (GLOBALFOUNDRIES, USA)
12.1: Automated Die Inking: A Pattern Recognition-based Approach
Constantinos Xanthopoulos (The University of Texas at Dallas, USA)
Peter Sarson, Heinz Reiter (ams AG, Austria)
Yiorgos Makris (The University of Texas at Dallas, USA)
12.2: Front-End Layout Reflection for Test Chip Design
Zeye Liu, Phillip Fynan, Ronald Blanton (Carnegie Mellon University, USA)
12.3: ITC-India Best Paper: Cognitive Approach to Support Dynamic Aging Compensation
Souhir Mhira (ST Microelectronics, France)

Session 13: Status Monitoring – Room 201 C

Chair:
Samy Makar (Stanford, USA)
Discussant:
Yanjing Li (University of Chicago, USA)
13.1: A Cloud-based Methodology for Online PVTA Monitoring
Shi-Yu Huang (National Tsing Hua University, Taiwan)
13.2: Changepoint-based Anomaly Detection in a Core Router System
Shi Jin (Duke University, USA)
Zhaobo Zhang (Huawei Technologies Co. Ltd., USA)
Krishnendu Chakrabarty (Duke University, USA)
Xinli Gu (Huawei Technologies Co. Ltd., USA)
13.3:  Symbol-based Health-Status Analysis in a Core Router System
Shi Jin (Duke University, USA)
Zhaobo Zhang (Huawei Technologies Co. Ltd., USA)
Krishnendu Chakrabarty (Duke University, USA)
Xinli Gu (Huawei Technologies Co. Ltd., USA)

Session 14: Safety and Test for Automotive ICs – Room 202 A/B

Chair:
O. Ballan (Xilinx, USA)
Discussant:
Paolo Bernardi (Politecnico di Torino, Italy)

14.1: Safety Analysis for Integrated Circuits in the Context of Hybrid Systems

V Prasanth, Rubin Parekhji (Texas Instruments, India)
Bharadwaj Amrutur (Indian Institute of Science, India)

14.2: Advanced Functional Safety Mechanisms for Embedded Memories and IP in Automotive SOCs

Tal Kogan (Intel, Israel)
Yehonatan Abotbol (Inomize, Israel)
Gabriele Boschi (Intel, Italy)
Gurgen Harutyunyan (Synopsys, Armenia)
Hanna Shaheen (Intel, Israel)

14.3: Some Considerations on Choosing an Outlier Method for Automotive Product Lines

Li-C. Wang, Sebastian Siatkowski, Chuanhe Shan, Matthew Nero (UC Santa Barbara, USA)
Nikolas Sumikawa, Leroy Winemberg (NXP, USA)