• International Test Conference

    The world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

  • 2017 introduction during plenary
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Watch 2016 Keynotes

photo-rhinesPlenary Keynote Speaker: Walden C. Rhines, Chairman and Chief Executive Officer of Mentor Graphics
The Business of Test: Test and Semiconductor Economics (click on title to view).

Wednesday Keynote Speaker: Professor Rob A. Rutenbar, University of Illinois, Urbana-Champaign
Hardware Inference Accelerators for Machine Learning (click on the title to view). This is a special keynote in honor of Professor Edward J. McCluskey.


Thursday Keynote Speaker: Ken Hansen, CEO, Semiconductor Research Corporation

Addressing Semiconductor Industry Needs: Defining the Future Through Creative, Exciting Research (click on title to view) 

Headlines

ITC 2016 in the News

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View some of the interesting press coverage of ITC 2016.

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Hotel Reservations for ITC2017 in Fort Worth

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Reservations for the two ITC Hotels in Fort Worth, the Sheraton and the Omni

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How do I get there?

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Book Your Ride From/To the DFW Airport through ITC and Save!

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phone: +1 (202) 973-8665
fax: +1 (202) 331-0111
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