Machine Learning during 2018 testweek

There is a big growth in the application of machine learning to electronics test.  You can see below that there are many topics related to machine learning.  Some really interesting applications.

Will the singularity take over test?

Sunday Tutorial:

Tutorial 3: Learning Techniques for Reliability Monitors, Mitigation and Adaptation

Tutorial 6: Machine Learning for Test & Test for Machine Learning

Monday Tutorial:

Tutorial 9: From Data to Actions: Applications of Data Analytics in Semiconductor Manufacturing & Test

Technical Sessions:

Special Session on Machine Learning:

Paper S4.1: The Emerging Applications of Machine Learning in Testing

Paper S4.2: Enhanced Lithographic Hotspot Detection Through Design of Experiments

Paper S4.3: Opportunities in Machine Learning and Test

Also see:

Paper 2.3: Systematic Defect Detection Methodology for Volume Diagnosis: A Data Mining Perspective

Paper 9.1: Kernel-based Clustering for Quality Improvement and Excursion Detection

Paper 12.1: Automated Die Inking: A Pattern Recognition-based Approach

Paper 12.3: ITC-India Best Paper: Cognitive Approach to Support Dynamic Aging Compensation

Paper 13.2: Changepoint-based Anomaly Detection in a Core Router System

Paper 13.3: Symbol-based Health-Status Analysis in a Core Router System

Paper 14.3: Some Considerations on Choosing an Outlier Method for Automotive Product Lines

Panel P3: Yield Learning at the Crossroads – Test Chips to the Rescue?
DATA Workshop – Machine Learning Day (Friday, Nov 2nd):

Keynote on Machine Learning, presented by Siemens

Talk 1: Machine Learning – Analog Test, ChoonWee Koay

Talk 2: Machine Learning – Synergy, Sam Joneidi

Talk 3: Machine Learning – Diagnosis, presented by CMU group

Talk 4: Machine Learning – Wafer Application, presented by UT-Dallas group

Talk 5: Machine Learning – System Test, presented by Duke group

Talk 6: Machine Learning – Production Yield, presented by UCSB group

Talk 7: Machine Learning – Security, Al Crouch

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