Machine Learning and AI are making a big impact in the field of electronic test!
ITC 2020 features a record number of talks devoted to the intersection of AI/Machine Learning and electronic testing.
In the Tuesday keynote: “Reverse Engineering Visual Intelligence,” James DiCarlo (Professor of Neuroscience, and Head of the Department of Brain and Cognitive Sciences at the Massachusetts Institute of Technology) “…will tell the story of how work in brain science, cognitive science and computer science converged to create deep neural networks that can support…[tasks such as visual object categorization and detection].”
In the Wednesday keynote, Ritu Favre will discuss “Applying Digital Transformation Technologies to Semiconductor Product Development.” In this talk, she will discuss “practical examples of how companies are utilizing technologies ranging from the remote automation to the cloud to artificial intelligence to transform modern engineering labs and enterprises.”
The Thursday keynote: “50 years of ITC! Now what?” by Rob Aitken (ARM Fellow) will discuss the increasing desire for data and analytics and the fact that “machine learning gives fast answers but few reasons.”
In addition, one of the top three “Distinguished Papers” selected from the ITC review process also covers Machine Learning and is entitled: “Learning A Wafer Feature With One Training Sample.”
Other sessions are devoted to the intersection of test and Machine Learning/AI. These include:
- Session 1A: Learning for Failure Analysis and Prediction
- Session 3B: Machine Learning Hardware and Applications
- Session 4A: Machine Learning for Reliable Operation
- Session 6D: Learning & Data Analysis (IP papers)
Finally, additional Machine Learning/AI papers are sprinkled throughout the program. This is an unprecedented year for the convergence of test and AI/Machine Learning at ITC. If you haven’t already registered, don’t forget to register for this exciting event at: http://www.itctestweek.org/register/