Plenary Keynote: Testing Beyond the Green Light
Presenter: Bob Klosterboer, EVP of the Analog Solutions Group, ON Semiconductor
Abstract: This presentation will highlight some of the challenges and opportunities that test developers and test operations managers face in a changing data climate. Measured data will drive decisions not only about the product under test but potentially on the entire design and manufacturing ecosystem. I will also explore some the value tradeoffs of increased data harvesting vs reduced test cost requirements of each component.
Bio: Robert Klosterboer joined ON Semiconductor in March 2008 and currently serves as Executive Vice President and General Manager of the Analog Solutions Group for ON Semiconductor and SCI LLC. From March 2008 to September 2012 he was Senior Vice President and General Manager of the business unit then known as the Automotive, industrial, Medical, & Mil/Aero Group. He has more than two decades of experience in the electronics industry. During his career, Mr. Klosterboer has held various engineering, marketing and product line management positions. Prior to joining ON Semiconductor in 2008, Mr. Klosterboer was Senior Vice President, Automotive & Industrial Group for AMI Semiconductor, Inc. Mr. Klosterboer joined AMIS in 1982 as a test engineer and during his tenure there he also was a design engineer, field applications engineer, design section manager, program development manager, and product marketing manager. Mr. Klosterboer holds a bachelor’s degree in electrical engineering technology from Montana State University.