Successful ITC-Asia Sept 13-15

The 1st IEEE International Test Conference in Asia

(ITC-Asia 2017)

Taipei, Taiwan

(Co-Located with SEMICON Taiwan)

September 13-15, 2017

(Program Highlights)1 Panel, 4 Keynote Speeches, 3 Half-Day Tutorials, 3 Embedded Tutorials, more than 10 Invited Talks from Industry, and 28 State-of-the-Art Technical Papers.


The entire technical program is available at


Heterogeneous Integration – Design and Test Challenges Organized by Prof. Cheng-Wen Wu

(Keynote Speeches)

Keynote 1: Hardware Security – Verification, Test, and Defense Mechanisms-       Prof. Tim Cheng (Hong Kong U. of Science and Technology)

Keynote 2: Convergence of Electronic and Semiconductor Systems, and Its Impact on Testing Technology – Dr. Ishih Tseng (Chroma ATE Inc.)

Keynote 3: Seven Major Trends that are Changing how we Test ICs-       Dr. Phil Nigh (GlobalFoundires)

Keynote 4: Test Emerging Memories-       Dr. Robert Aitken (ARM Research) We sincerely look forward to your participation,

Best Regards,

Steering Committee Chair:  Cheng-Wen Wu

General Co-Chairs:  Kuen-Jong Lee and Li-C. Wang

Program Chair:  Shi-Yu Huang

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