History

ITC: A Forum for Exchange… The Harbinger of Change

In 1970, engineers facing the test challenges posed by the then-novel semiconductor memory device organized a symposium on IC testing. That meeting at the Rickshaw Inn in Cherry Hill, NJ drew a crowd of 147 people. That symposium is now a week-long conference attended by more than 4,000 engineers from around the world.

In its thirty year history, International Test Conference has become the world’s leading electronics test conference . No other industry has changed as much – or changed the world as much – in those thirty years as semiconductor technology. ITC has kept pace, always seeking to develop new and innovative ways to fulfill its primary objective: the exchange of technical information.

ITC Brings the Test Industry Together

Over the years, the conference has evolved into the “annual meeting” of the test industry. Technical sessions, complemented by tutorials and exhibits of test equipment and related services, have provided an opportunity for participants to see and discuss the latest available products and systems. Today, more than 125 companies exhibit at ITC, making it the largest single exposition of semiconductor test products, systems and services in the world.

Now, more than ever, as semiconductor technology and testing issues become more complex, challenging and global, ITC is playing an increasingly important role as the industry’s meeting place, its principal forum for exchange and its harbinger of change. As “Cherry Hill” lingers on as a fondly familiar nickname, it is interesting to contemplate what ITC will be like in the next millennium.

Conference highlights and themes:

1970 The first symposium on test is held in Cherry Hill, NJ at the Rickshaw Inn.

1971 Memory testing remains the central topic and organizers decide to make the meeting an annual event.

1972 “Testing To Integrate Semiconductor Memories Into Computer Mainframes”

1973 Symposium on Semiconductor Memory Testing

1974 Memory testing is a high-interest topic, as are the challenges of functionally testing microprocessor and microcomputer chips.

1975 Fundamental memory test theories continue to appear in presentations.

1976 Microprocessors, reliablity, design for test, test facilities and techniques,and test languages emerge as hot topics.

1977 Memory papers are upstaged by board test, software, and design for testability.

1978 “Can Complex LSI Continue To Be Effectively Tested At Both The Component Level And The Board Level”

1979 “Complex LSI Component And Board Testing Have Common Challenges – Learn How To Solve Them”

1980 “Testing For The 1980’s – Expanding Challenges And Increasing Opportunities”

1981 “Test For The 1980’s – The Key To VLSI Producibility”

1982 “Quality, Productivity And Profit”

1983 “Testing’s Changing Role”

1984 “The Three Faces Of Test: Design, Characterization, Production”

1985 “The Future Of Test”

1986 “Testing’s Impact On Design & Technology”

1987 “Integration Of Test With Design And Manufacturing”

1988 “New Frontiers In Testing”

1989 “Meeting The Tests Of Time”

1990 “The Changing Philosophy Of Test”

1991 “Test: Faster, Better, Sooner”

1992 “Discover The New World Of Test & Design”

1993 “Design, Test, And Diagnostics – Join Them”

1994 “Test: The Next 25 Years”

1995 “Driving Down the Cost of Test”

1996 “Test and Design Validity”

1997 “Total Quality”

1998 “Core Challenges”

1999 “Test and the Product Life Cycle”

2000 “Test Challenges of Faster and Smaller Technologies”

2001 “Tackling Test Tradeoffs”

2002 “Stressing the Fundamentals”

2003 “Breaking Test Interface Bottlenecks”

2004 “Testing From Fab to Field”

2005 “Test: Survival of the Fittest”

2006 “Getting More Out of Test”

2007 “Facing Nanometer-technology Test Challenges”