About Us
ITC 2010 was held in Austin, Texas November 2-4. Test Week activities took place October 31-November 5.
ITC2010 was a huge success! We had many exciting new programs and tracks in our core areas but also adjacent areas. We launched the very successful partner conference track. The track offered a chance to sample papers from some of the most successful workshops and conferences somewhat adjacent to ITC, without having to travel about 5,000 miles to attend and sample these conferences. Attendees raved how the track helped them navigate through the maze of workshops and conferences in adjacent areas!
The conference began with a keynote address by Dr. James Truchard, CEO and co-founder of National Instruments. Moreover, Dr. John Cohn, Fellow and Chief Scientist for Design Automation at IBM was our invited speaker. He is very passionate about promoting science and engineering. Because of this he spent 58 days living and inventing in an abandoned steel mill as part of Discovery Channel’s technical survival show “The Colony”. The attendees on the first row definitely needed their safety glasses. Our second invited speaker was Dr. Philip Wong, Professor of Electrical Engineering at Stanford University. He discussed how the semiconductor industry is at a turning point with exceptional opportunities for device, design, and test communities to have a deep and long lasting impact on this US$260B industry.
In addition to our top-notch plenary speakers, we had a dynamic exhibit floor with major industry suppliers displaying their latest products and technologies. There was also a corporate track which is a great opportunity to learn about some of the exciting new technologies marketed by many of our exhibitors without having to change your seat!
Our technical sessions included relevant and timely topics such as building low-cost ATE, microprocessor test, DFT advances, yield, post-silicon validation, 3D test. Moreover, this year, we also hosted sessions in adjacent areas such as RTL and high-level test and bio-fluidics as well as the TTTC/IEEE Ph.D. Dissertation Award Finals! The technical sessions were complemented by exciting panels on important questions such as whether scientific methods are necessary to solve our analog, mixed-signal and RF test problems and panels to understand 3D test challenges as well as potential solution concepts. Just like last year, we had a very successful poster track of almost 22 posters, combined with our Texas Beer Blast!