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Sunday, November 10
morning afternoon
1 High-Speed I/O Testing in High-Volume Manufacturing Salem Abdnnadher (Intel Corp) 4 Machine Learning in Design & Test – A Journey to AI Li-C Wang (UCSB)
2 Cost Effective DFT and Test for Embedded Analog Rubin Parekhji, Maheedhar Jalasutram, Malav Shah (Texas Instruments) 5 Mixed-Signal DFT & BIST: Trends, Principles, and Solutions Stephen Sunter (Mentor, A Siemens Business)
3 Power-Aware Testing in the Era of IoT Patrick Girard (LIRMM/CNRS), Xiaoqing Wen (Kyushu Institute of Technology) 6 Scan Test Escapes, New Fault Models, and the Growing Need for Functional System Level Tests Adit D. Singh (Auburn University)
Monday, November 11
morning afternoon
7 Memory Test and Repair in FinFET Era Yervant Zorian (Synopsys) 10 Automotive Reliability & Test Strategies Riccardo Mariani (Intel), Yervant Zorian (Synopsys)
8 Applications of Machine Learning in Semiconductor Manufacturing and Test Haralampos G. Stratigopoulos (Sorbonne Université, CNRS, LIP6), Yiorgos Makris (Univ. of Texas at Dallas) 11 Machine Learning for Reliability of ICs and Systems Mehdi Tahoori (Karlsruhe Institute of Technology), Krishnendu Chakrabarty (Duke University)
9 Improving Test Quality of Digital ICs Erik Jan Marinissen (imec), Adit D.Singh (Auburn University) 12 From Test to Post-Silicon Validation: Concepts and Recent Trends Arani Sinha (Intel Corporation), Sandip Ray (University of Florida)