Workshops for 2017

IEEE Computer Society Test Technology Technical Council Workshops

Thursday and Friday

General Workshop Information

Two workshops are being held in parallel immediately following ITC 2017. They start with an opening address on Thursday afternoon, November 2, followed by a technical session. A reception for all workshop participants will be held on Thursday evening. The remaining the technical sessions will be held on Friday, November 3. The technical scope of each workshop is described below.

 

Workshop Registration

All workshop participants require registration. To register in advance for one of the workshops, do so online. Otherwise, register on-site at regular rates during Test Week at the ITC registration counter. Admission for on-site registrants is subject to availability. Discount workshop registration rates apply until October 1, 2017. See the registration page for details. Workshop registration includes the opening address, technical sessions, digest of papers, workshop reception, break refreshments, continental breakfast and lunch.

 

Digest of Papers

A digest of papers will be distributed only to attendees at the workshops as an informal proceedings.

 

Workshop Schedule

Both workshops will adhere to the same schedule:

 

            Thursday, November 2                Friday, November 3
Registration 2:00 p.m. – 7:00 p.m. Registration 7:30 a.m. – 10:00 a.m.
Opening Address 4:00 p.m. – 4:30 p.m. Technical Sessions 8:00 a.m.  –  4:00 p.m.
Technical Session 4:30 p.m. – 6:30 p.m.
Reception 7:00 p.m. – 9:00 p.m.

 

                      Note: Workshop schedule is subject to change

 

Further Information

For more information on the two workshops contact their organizers by e-mail or check the TTTC Web site or see the ITC web workshop page.

 

Scope: The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, stringent runtime requirements for functional safety, security and cost constraints of a mass market the reliable operation of electronics in safety-critical domains is still a major challenge. The ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike. The scope of the workshop includes, but not limited to:

  • Functional Safety in automotive domain
  • Validation of automotive systems
  • Aging effects on automotive electronics
  • Automotive standards and certification
  • Power-on & Periodic Self-test
  • High quality test and DPPB
  • Robustness and Security in Automotive

 

General Chair: Yervant Zorian, zorian@synopsys.com

Program Chair: Paolo Bernardi, paolo.bernardi@polito.it

 

  • DATA: IEEE International Workshop on Defect, Adaptive Test, Yield and Data Analysis

Scope: In test, we use data every day. Yield data, throughput data, statistical data, reliability data, outlier data, general production data are all in everyday use. However, data means much more than that. Advances in our industry allow data from wafer fab to be reused in studying system level test results. Field failure studies now routinely uses wafer probe data to understand root cause. Data has now become a product life cycle requirement—cradle to grave. Today access to the data has become an issue; the control and sharing of data among business partners. How to efficiently process data to extract the golden nuggets of useful information amid the gigabytes of unimportant noise remains a focus and a challenge for test professionals. Workshop topics to include:

  • Data storage and security
  • Analog fault modeling & coverage
  • Adaptive test for product engineers
  • Data mining methods for test data processing
  • High/low voltage and stress testing
  • Yield learning and analysis
  • Fault localization and diagnosis
  • Product and project case studies
  • Advanced DPPM reduction techniquew

 

General Chair: Jeff Roehr, JLRoehr@Gmail.com

Program Chair: Wesley Smith, smith.wesley@siemens.com

 


 

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